Hello Team,

 

 

 

 

Its been well known to everyone that whenever we have Defects counts of data with samples it is easy to calculate DPMO, DPU, Z bench LT and Z bench ST.

 

 

 

 

 

But, when we use "Defectives" data distribution with samples how we can use DPMO in that case to calculate sigma value.

 

 

 

 

 

 

 

 

Regards,

 

 

Rajiv N

 

 

Mumbai

 

Defectives vs DPMO vs Yield vs Sigma Level

 

Defectives as a data set does not make use of opportunities for error existing in a process. Defective is an entire unit while defects are the number of non conformities, which might be more then one in a unit. Customers generally prefer using defectives data to gauge the performance of a process. Yield (non defectives) is likely to be their prime metric. Process owners need to be detail oriented and generally prefer to use DPMO as their prime metric.

 

 

A special case - If there is just one opportunity for error per unit, number of defects and defectives is the same. In such a case, DPMO method provides same sigma level as yield method and conversion is simple - if DPMO is 10000, yield is 99%.

 

Hope this helps.